X-Ray (2-D) Examination

//X-Ray (2-D) Examination
X-Ray (2-D) Examination 2017-01-23T19:15:15+00:00

2-D X-Ray

2D X-ray is a non-destructive failure analysis technique to inspect internal construction of a sample.   An X-Ray inspection is used to identify damaged, broken, shorted… interior of semiconductors.   Comparative X-Ray images from a failing device and a reference sample are fast and low cost inspection methods that are used in design, development, production and fault isolation of semiconductors.   X-ray images can reveal cracks, wire bonds anomaly, die size, voids… in an electronic device.   The following are a few pictures of 2D X-Rays.

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