SEM (Scanning Electron Microscopy)

Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes are used for inspecting topographies and composition of materials with a magnification range that encompasses that of optical microscopy and extends it to the nano-scale. ICFA Lab offers a variety of advanced SEMs to meet customer requirements and application needs.
The electron beam is generally scanned in a raster scan pattern, and the beam’s position is combined with the detected signal to produce an image. Specimens can be observed in high vacuum, in low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures.
The most common SEM mode is detection of secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons that can be detected depends, among other things, on the angle at which beam meets surface of specimen.

SEM_Die-examination1
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Hitachi_SEM_SU8220

Hitachi SU8220