2D X-ray is a non-destructive failure analysis technique to inspect internal construction of a sample. An X-Ray inspection is used to identify damaged, broken, shorted… interior of semiconductors. Comparative X-Ray images from a failing device and a reference sample are fast and low cost inspection methods that are used in design, development, production and fault isolation of semiconductors. X-ray images can reveal cracks, wire bonds anomaly, die size, voids… in an electronic device. The following are a few pictures of 2D X-Rays.