{"id":356,"date":"2021-09-28T14:55:04","date_gmt":"2021-09-28T14:55:04","guid":{"rendered":"https:\/\/icfailureanalysis.com\/?page_id=356"},"modified":"2022-01-23T09:52:11","modified_gmt":"2022-01-23T09:52:11","slug":"sims-secondary-ion-mass-spectrometry","status":"publish","type":"page","link":"https:\/\/icfailureanalysis.com\/sims-secondary-ion-mass-spectrometry\/","title":{"rendered":"SIMS (SECONDARY ION MASS SPECTROMETRY)"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"356\" class=\"elementor elementor-356\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-1e6ee5d8 elementor-section-height-min-height elementor-section-boxed elementor-section-height-default elementor-section-items-middle\" data-id=\"1e6ee5d8\" data-element_type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t\t<div class=\"elementor-background-overlay\"><\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-35a7447b\" data-id=\"35a7447b\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-65c934be elementor-widget elementor-widget-heading\" data-id=\"65c934be\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.21.0 - 18-04-2024 *\/\n.elementor-heading-title{padding:0;margin:0;line-height:1}.elementor-widget-heading .elementor-heading-title[class*=elementor-size-]>a{color:inherit;font-size:inherit;line-height:inherit}.elementor-widget-heading .elementor-heading-title.elementor-size-small{font-size:15px}.elementor-widget-heading .elementor-heading-title.elementor-size-medium{font-size:19px}.elementor-widget-heading .elementor-heading-title.elementor-size-large{font-size:29px}.elementor-widget-heading .elementor-heading-title.elementor-size-xl{font-size:39px}.elementor-widget-heading .elementor-heading-title.elementor-size-xxl{font-size:59px}<\/style><h1 class=\"elementor-heading-title elementor-size-default\">SIMS (SECONDARY ION MASS SPECTROMETRY)<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-d996917 elementor-align-center elementor-widget elementor-widget-breadcrumbs\" data-id=\"d996917\" data-element_type=\"widget\" data-widget_type=\"breadcrumbs.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<nav aria-label=\"breadcrumbs\" class=\"rank-math-breadcrumb\"><p><span class=\"last\">IC Failure Analysis Lab<\/span><\/p><\/nav>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-bf2b28b elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"bf2b28b\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-b459a1d\" data-id=\"b459a1d\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-cde58b8 elementor-widget elementor-widget-spacer\" data-id=\"cde58b8\" data-element_type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.21.0 - 18-04-2024 *\/\n.elementor-column .elementor-spacer-inner{height:var(--spacer-size)}.e-con{--container-widget-width:100%}.e-con-inner>.elementor-widget-spacer,.e-con>.elementor-widget-spacer{width:var(--container-widget-width,var(--spacer-size));--align-self:var(--container-widget-align-self,initial);--flex-shrink:0}.e-con-inner>.elementor-widget-spacer>.elementor-widget-container,.e-con>.elementor-widget-spacer>.elementor-widget-container{height:100%;width:100%}.e-con-inner>.elementor-widget-spacer>.elementor-widget-container>.elementor-spacer,.e-con>.elementor-widget-spacer>.elementor-widget-container>.elementor-spacer{height:100%}.e-con-inner>.elementor-widget-spacer>.elementor-widget-container>.elementor-spacer>.elementor-spacer-inner,.e-con>.elementor-widget-spacer>.elementor-widget-container>.elementor-spacer>.elementor-spacer-inner{height:var(--container-widget-height,var(--spacer-size))}.e-con-inner>.elementor-widget-spacer.elementor-widget-empty,.e-con>.elementor-widget-spacer.elementor-widget-empty{position:relative;min-height:22px;min-width:22px}.e-con-inner>.elementor-widget-spacer.elementor-widget-empty .elementor-widget-empty-icon,.e-con>.elementor-widget-spacer.elementor-widget-empty .elementor-widget-empty-icon{position:absolute;top:0;bottom:0;left:0;right:0;margin:auto;padding:0;width:22px;height:22px}<\/style>\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-eed7fed elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"eed7fed\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-8323fba\" data-id=\"8323fba\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-e24c9f1 elementor-widget elementor-widget-heading\" data-id=\"e24c9f1\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Secondary Ion Mass Spectrometry (SIMS)<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-cb13c4d elementor-widget elementor-widget-text-editor\" data-id=\"cb13c4d\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.21.0 - 18-04-2024 *\/\n.elementor-widget-text-editor.elementor-drop-cap-view-stacked .elementor-drop-cap{background-color:#69727d;color:#fff}.elementor-widget-text-editor.elementor-drop-cap-view-framed .elementor-drop-cap{color:#69727d;border:3px solid;background-color:transparent}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap{margin-top:8px}.elementor-widget-text-editor:not(.elementor-drop-cap-view-default) .elementor-drop-cap-letter{width:1em;height:1em}.elementor-widget-text-editor .elementor-drop-cap{float:left;text-align:center;line-height:1;font-size:50px}.elementor-widget-text-editor .elementor-drop-cap-letter{display:inline-block}<\/style>\t\t\t\t<p style=\"text-align: justify;\">Secondary Ion Mass Spectrometry (SIMS) is technique used for surface material characterization of a solid specimen. SIMS is recognized as the most sensitive elemental, isotopic and molecular composition analysis the uppermost atomic layers of the specimen. The following are a few strength and limitations of SIMS :<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-c1517c8 elementor-widget elementor-widget-text-editor\" data-id=\"c1517c8\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p style=\"text-align: justify;\"><b>Strengths:<\/b><\/p><ul><li>The analysis consumes very small sample (essentially non-destructive).<\/li><li>High sensitivity means that specimens with low concentration levels (down to Parts Per Billion levels) can be analyzed with SIMS.<\/li><li>High sensitivity also allows for depth profiling of molecular and elemental abundances as well as isotopic ratios.<\/li><li>SIn situ analysis eliminates the need for complex sample preparation in most cases.<\/li><\/ul><p style=\"text-align: justify;\"><b>\u00a0<\/b><\/p><p style=\"text-align: justify;\"><b>Limitations:<\/b><\/p><ul><li style=\"text-align: justify;\">Because both atomic and molecular species are produced during sputtering of the samples, not all elements in all substrates (matrices) can be analyzed quantitatively.<\/li><\/ul>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-e5014ce elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"e5014ce\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-930b5e8\" data-id=\"930b5e8\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3cbdff5 elementor-widget elementor-widget-text-editor\" data-id=\"3cbdff5\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p style=\"text-align: justify;\"><b>\u00a0<\/b><\/p><p style=\"text-align: justify;\"><b>Typical Applications:<\/b><\/p><ul><li style=\"text-align: justify;\">Measuring quantitative depth profiling of dopants and impurities in semiconductor substrates.<\/li><li style=\"text-align: justify;\">Identifying lubricants on magnetic hard discs.<\/li><li style=\"text-align: justify;\">Profiling thickness of insulating films on glass.<\/li><li style=\"text-align: justify;\">Mapping elemental and molecular patterned surfaces.<\/li><li style=\"text-align: justify;\">Identifying compounds in thin organic films.<\/li><li style=\"text-align: justify;\">Determining the extent of crosslinking in polymers.<\/li><\/ul>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-00883ce\" data-id=\"00883ce\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3432821 elementor-widget elementor-widget-image\" data-id=\"3432821\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<style>\/*! elementor - v3.21.0 - 18-04-2024 *\/\n.elementor-widget-image{text-align:center}.elementor-widget-image a{display:inline-block}.elementor-widget-image a img[src$=\".svg\"]{width:48px}.elementor-widget-image img{vertical-align:middle;display:inline-block}<\/style>\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"300\" height=\"261\" src=\"https:\/\/icfailureanalysis.com\/wp-content\/uploads\/2021\/09\/SECONDARY-ION-MASS-SPECTROMETRY.gif\" class=\"attachment-full size-full wp-image-359\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-7ba56cc elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"7ba56cc\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-0537f86\" data-id=\"0537f86\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-6b90de2 elementor-widget elementor-widget-spacer\" data-id=\"6b90de2\" data-element_type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-9a8a1f6 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"9a8a1f6\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-471a553\" data-id=\"471a553\" data-element_type=\"column\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-00d8bdb elementor-widget elementor-widget-text-editor\" data-id=\"00d8bdb\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p><a href=\"https:\/\/icfailureanalysis.com\/i-v-curve-trace-measurement\/\">i-v curve analysis<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/laser-chemical-decapsulation\/\">ic decapsulation service<\/a>\u00a0\u2022 <a href=\"https:\/\/icfailureanalysis.com\/counterfeit-component-authenticity\/\">Counterfeit Component Authenticity<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/cross-sectioning\/\">Cross Section Analysis<\/a>\u00a0\u2022 <a href=\"https:\/\/icfailureanalysis.com\/delayering-parallel-lapping\/\">Parallel Lapping<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/edx-eds\/\">Energy Dispersive X-Ray Spectroscopy<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/fib-focused-ion-beam-precision-cutting\/\">Focused Ion Beam<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/om-optical-microscopy\/\">optical microscopy failure analysis<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/photo-emission-microscopy\/\">Photoemission microscopy failure analysis<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/scanning-acoustic-microscopy-sam\/\">Scanning Acoustic Microscopy<\/a> \u2022 <a href=\"https:\/\/icfailureanalysis.com\/sem-scanning-electron-microscopy-2\/\">electron microscope services<\/a>\u00a0\u2022 <a href=\"https:\/\/icfailureanalysis.com\/ic-x-ray-services\/\">IC X-Ray services<\/a><\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-4aa0731 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"4aa0731\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-9d1f1f3\" data-id=\"9d1f1f3\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-adf4c8f elementor-widget elementor-widget-spacer\" data-id=\"adf4c8f\" data-element_type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>SIMS (SECONDARY ION MASS SPECTROMETRY) IC Failure Analysis Lab Secondary Ion Mass Spectrometry (SIMS) Secondary Ion Mass Spectrometry (SIMS) is technique used for surface material characterization of a solid specimen. SIMS is recognized as the most sensitive elemental, isotopic and molecular composition analysis the uppermost atomic layers of the specimen. The following are a few [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"_links":{"self":[{"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/pages\/356"}],"collection":[{"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/comments?post=356"}],"version-history":[{"count":0,"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/pages\/356\/revisions"}],"wp:attachment":[{"href":"https:\/\/icfailureanalysis.com\/wp-json\/wp\/v2\/media?parent=356"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}