SCANNING ACOUSTIC MICROSCOPY (SAM)
Scanning Acoustic Microscopy (SAM) or Scanning Acoustic Tomography (SAT)
SAM / SAT is a non-invasive & non-destructive failure analysis technique that inspects for voids, cracks, delaminations in a sample. SAM sends a focused sound wave through the package and interprets the change of the sound wave with the package.
Also read : electron microscope services
SAM is a superior tool to detect delaminations of sub-micron (down to 100nm) thicknesses. SAM can also measure thickness of an internal layer of s specimen. Scanning acoustic microscopy has many modes. The following are the most common modes used in failure analysis of an IC.
- A-Scan Mode (Amplitude Scan) : is a real time oscilloscope waveform of the sound waves collected at a single X-Y section or point
- C-Scan Mode (Confocal Scan) : is an image of acoustic reflection collected at the focused plane (X-Y plane) of interest at a particular depth (Z). The image plane is parallel to the surface of device.
- Through-Scan Mode : two separate transducers are used to send and receive acoustic waves. These transducers are positioned on opposite sides of the specimen.
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